{
  "id": "skill-area:quality-control-statistical",
  "_kind": "SkillArea",
  "_file": "domain/skill-areas/skill-areas-expanded-3.yaml",
  "_cluster": "domain",
  "attributes": {
    "displayName": "Statistical Quality Control",
    "description": "Applying statistical methods to manufacturing quality — control charts\n(X-bar, R, p, c), process capability indices (Cp, Cpk), acceptance sampling\nplans, and measurement system analysis (Gage R&R).\n",
    "expertiseLevels": [
      "practitioner",
      "expert"
    ]
  },
  "outgoingEdges": [
    {
      "from": "skill-area:quality-control-statistical",
      "to": "domain:industrial-automation",
      "kind": "applies_to",
      "attributes": {
        "confidence": "primary"
      }
    },
    {
      "from": "skill-area:quality-control-statistical",
      "to": "domain:industrial-engineering",
      "kind": "applies_to",
      "attributes": {
        "confidence": "secondary"
      }
    }
  ],
  "incomingEdges": []
}